Our course registration deadline passed in February, and the course for 2016 is now full. Register an interest by emailing This email address is being protected from spambots. You need JavaScript enabled to view it. if you would like to know when the next course is announced.


Click the image below to go to the course information page, or email This email address is being protected from spambots. You need JavaScript enabled to view it. for enquiries about our course.

 

 

Dimensional measurements of nanoparticles are extremely important for their applications in a diverse range of fields. The unique properties of nanoparticles depend strongly on their size, so it’s extremely important to be able to characterize, and control nanoparticle sizes. For example, an extremely small change in the dimension of a quantum dot nanoparticle will give rise to dramatically different photoluminescence characteristics. in the case of metallic nanoparticles, the size of the particle will alter light absorption and scattering properties, which are highly important for many applications, including in disease diagnosis and therapy (1). Many other properties depend on nanoparticle size, including magnetic and mechanical properties, interactions with cells and tissues, etc. The shape of nanoparticles also has a strong effect on these properties.

 

Thus, in nanoscience, it is crucial to have a tool that can simply characterise particles size and shape of nanoparticles, irrespective of the material of which they are composed, with sub-nanometer resolution. The figure below shows AFM imaging of a variety of nanoparticle types.

images of three nanoparticle types

Figure above shows (L-R) silica nanospheres, organometallic nanorods, and gold nanotriangles all imaged by AFM. Adapted from figure 7.11 of Eaton and West, Atomic Force Microscopy(2)

 

AFM fulfils these requirements, z-axis (height) measurements in AFM can be accurate to within 0.1 nm. AFM also has several other advantages for characterisation of nanoparticles:

 

The deadline for our 2015 AFM training workshop has passed, and we cannot take any more registrations. If you want to be informed when the next course is announced, email me. For more details about the courses click here, or download the flyer below.

flyer for 2015 course

I am going to be teaching on two new AFM short courses to be held this summer. The courses are:

AFM Advanced Operation Techniques

and

AFM Bioapplications

Both of these courses will be taught at the headquarters of AFMWorkshop in California, USA, but will be open to, and suitable for, users of all instruments. The courses will be a mix of lectures and practical work with different microscopes.

Both courses are taking place in mid-July. Follow this link to a .pdf brochure, and consult the AFM Workshop website for more details on these courses.

At the time of writing there are places available on both courses, but places will be very limited. I recommend reserving a place ASAP from AFMWorkshop, if you are interested.

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