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2. Scanner Artifacts

 

2.1 Piezo Creep


Piezo creep occurs because when you apply a set voltage to the piezo(scanner), and then try to maintain it, in order to move to a certain location, the piezo tends to continue to move in the same direction for a certain period of time. Essentially, this means that when you start a new scan, you will get some stretching or compression of features at the beginnning of the image, and then the image will start to appear more normal over time.
The effect will be particularly pronounced if you move to a new place within your scan range.
See the example below.

AFM image showing piezo or scanner creep artifact

In the example above, the image is distorted at the top due to scanner creep.

How to avoid it
The simplest thing to do is just wait until it disappears, and start scanning again. Even better, set the AFM to scan one line continuously. Select the first line of the area you wish to scan, and wait until the image stabilises (i.e. that line is always the same), then start scanning the image properly.
AFMs with linearised scanner do not suffer from this effect. many modern AFMs have such scan linearising features. More details about his can be found in the book "Atomic Force Microscopy".
Note that distorted features all over your image, not just at the start, are due to something else, maybe sample drift.

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