Chapter 3 is all about the different AFM modes and experiments that can be carried out. The variety of different imaging methods, and the ability to use other modes to detect different properties of the sample, are the real reason for the widespread use of AFM.
In this chapter, the book covers: Topographic modes: contact mode and oscillating modes. Then it moves onto non-topographic modes, including force spectroscopy, Nanoindentation, mechanical property imaging, lateral force microscopy, phase imaging, other dynamic modes, magnetic force microscopy, EFM and SKPM, electrochemical AFM, and thermal modes.Finally, it also covers methods that allow surface modification.
Chapter 3 - AFM modes
1. What was the first AFM mode invented?
2. In LFM, what factors make the probe twist more?
3. What is the error signal for intermittent contact mode?
4. What is the error signal for contact mode?
5. How is friction force microscopy also known?
6. In MFM, why is the probe sensitive to magnetic forces?
7. In which mode might you obtain an amplitude image?
8. Why are higher harmonics modes useful?
9. What is chemical force microscopy?
10. Name two major advantages of AFM-based nanoindentation.
11. What techniques can be used to image mechanical properties?
12. What properties can Kelvin probe microscopy determine?
13. What techniques can be used to modify a surface with AFM?
14. Long Question: Explain the difference between non-contact and intermittent contact AFM. What are their principle advantages over contact mode?
15. Picture Question: Mark in this table the conditions used for intermittent contact AFM (mark as IC-AFM), and non-contact AFM (NC-AFM). If a condition is rarely used mark N/A.