Measuring AFM ImagesQuiz on acquiring AFM Images

This chapter explains how to measure AFM images properly.The topics covered include sample preparation, preparing the microscope for imaging, including optical alignment, optimisation of imaging parameters, and acquiring high-resolution images. There are sections covering contact mode, intermittent contact, lateral force microscopy and acquiring other signals, and measuring force curves.

The quiz will check if you remember important concepts, and avoid common mistakes when acquiring data.

Short Questions

1.    In the flow chart describing the steps in measuring AFM images, what step is different for contact or intermittent-contact modes?
2.    What is the first step to carry out to measure an AFM images of your sample
3.    What will be the effect of using the wrong tip approach parameters?
4.    What is the effect of having the PID settings too high?
5.    Which substrates are most suitable to images very small features like single molecules?
6.    What will be the effect of having the PID values too low?
7.    In intermittent contact mode, what is the ideal operating frequency in air?
8.    What sort of probes should be used for intermittent contact mode imaging in liquid?
9.    When changing to faster scanning speeds, what changes to feedback settings might be required?
10.    In LFM, what can help to distinguish true friction contrast from topographical effects?
11.     What are the primary purposes of the coarse adjust mirror?
12.    What are the four major requirements in sample preparation?

Long Question

13.    What factors are important when attempting to carry out high resolution imaging?

Picture Question

14.     Mark on the picture of a cantilever below the correct place where the laser spot should be focussed.


15.    Mark a horizontal line in this image indicating at which point the feedback parameters were correct.The gains were increased from top to bottom.


image of test grid at differnet setpoints


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NOTE: All images copyright Peter Eaton/OUP 2010.