This page has a list of corrections to the book "Atomic Force Microscopy".  If you notice any more mistakes, please let me know here. That way I can correct them in the next edition!

 

Important Note: All these errors will be corrected in the upcoming paperback edition. If you know of any more, let me know! 

Errors

  • Page 30 - Equation 2.6: Verr is used in place of Zerr in the first term.

 

  • Page 38 - The last paragraph erroneously refers to equations 2.5, 2.6 and 2.7, where it should be 2.7, 2.8 and 2.9, respectively.

 

  • page 53 - referring to the figure shown below:
Figure 3.4 - Canitlever and photodetector

In this figure, vertical bending is detected as "(A+B)-(C+D)", i.e. the difference of the top two and bottom two segments. On page 53 the book erroneously says "(A+B)-(C-D)".

 

  • Page 56 - Figure 3.6 Should read: "B-intermittent contact oscillation (large)".

 

  • Page 66 - Legend refers to colours in the image where there are none.

 

  • Page 114 - Section 5.2.4: Three-dimensional views. Should read: "...special glasses to differentiate the left eye's and right eye's views...".

 

  • Page 116 - Table 5.2. The Formula for skewness is incorect. The exponents should be 3, not 4. i.e., as shown below

Skewness formula

 

  • Page 164 - Misspelling of "fimbriae" as "fibriae".

 

Thanks very much to everyone who informed me of these errors!

Afmhelp.com has just been published, it does not have much content right now, but it's coming soon.

The website will launch towards the end of 2009, for more information see "About AFMHelp.com".

About AFMHelp.com

 

  • What's this site about?

  This site is designed to offer help with atomic force microscopy (AFM). AFM is an amazing and powerful technique for measuring images, and making other measurements of a wide range of samples. However, it can be rather daunting to use, especially for the beginner. On this website, as well as in the accompanying book we've collected a lot of information that explains how AFM works, and howto use AFM, and to process and analyse the images.

 

  • What's AFM?

There's a lot of information about AFM all over this website,  but for an overview, take a look at the AFM: Beginner's Guide page, and for frequently asked questions check out the AFM FAQ.

 

Frequently Asked Questions about Atomic Force Microscopy

by Peter Eaton

This FAQ was originally created for clients of the AFM, i.e. those whose samples I scan.
However, it's grown a lot, and should also answer many questions of people planning to use the AFM themselves, or researching the technique. Its contents include a description of AFM suitability to various samples, sample preparation, tips for scanning and data processing, and a short bibliography. There is also a guide to recognising artifacts in AFM.

All the material here is discussed in greater detail in the book "Atomic Force Microscopy".

 

About AFMHelp.com

 All content on this website is copyright 2009 Peter Eaton. Some images are copyright 2009 Peter Eaton and Paul West. No re-use without permission. For permission to re-use contact us here.

 

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