UPDATE: The site has been upgraded to new back-end code. This should help stability and enable new features in the future. Hopefully all the old pages are working now on the new code. If you see any problems, let me know!
The design of the site was changed a little, it looks kind of plain now, maybe I'll revert to the old look later.
There is now a new AFM Image Gallery, which contains more images than before, organised in categories and a few by instrument.
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Many people have asked me for a copy of this simple figure, showing how the AFM works. It's available for download below as a high quality .ppt file.
Please note the image is copyright 2010 Peter Eaton, and permission is given only for academic and educational use, excluding publishing. Please contact me if you want to use any other images on this website.
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As discussed in the appendices A and B of my book, reference and calibration samples are extremely important for AFM. Calibration samples allow the AFM to make accurate, quantitative measurements. Reference samples can be used for training, and certification, and just to check if the instrument (or the probe) are performing as they should. There's a list of commercially available calibration and reference samples here.
AFM piezoelectric scanners tend to change their responses and age over time, so it's necessary they they be recalibrated periodically (typically annually). All these repeated uses can lead to reference samples becoming dirty and contaminated. This leads to serious problems, because a contaminated samples cannot be properly used for calibration of an instrument, and may also be difficult to use as a reference sample. The article below explains some techniques that can be used to clean AFM calibration and reference samples. Note that this method o sample cleaning first appeared at AFMWorkshop.com. I learned the "NewSkin" method while visiting their headquarters.
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I am going to be teaching on two new AFM short courses to be held this summer. The courses are:
Both of these courses will be taught at the headquarters of AFMWorkshop in California, USA, but will be open to, and suitable for, users of all instruments. The courses will be a mix of lectures and practical work with different microscopes.
At the time of writing there are places available on both courses, but places will be very limited. I recommend reserving a place ASAP from AFMWorkshop, if you are interested.
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