afmhelp.com

 The book, "Atomic Force Microscopy" by Peter Eaton and Paul West will be published in March 2010 by OUP.

There is some information about it at this site, but it's somewhat out of date. In particular the contents listing is not quite correct.

Here is the correct chapter list for "Atomic Force Microscopy": 

Preface

Chapter 1: Introduction
1.1 Background to AFM
1.2 AFM today

Chapter 2: Instrumental Aspects of AFM
2.1 Basic concepts in AFM instrumentation
2.2 The AFM stage
2.3 AFM electronics
2.4 Acquisition software
2.5 AFM cantilevers and probes
2.6 AFM instrument environment
2.7 Scanning environment

Chapter 3: AFM Modes
3.1 Topographic modes
3.2 Nontopographic modes
3.3 Surface modification

Frequently Asked Questions about Atomic Force Microscoy

by Peter Eaton

This FAQ was originally created for clients of the AFM, i.e. those whose samples I scan.
However, it's grown somewhat, and should also answer many questions of people planning to use the AFM themselves, or researching the technique. Its contents include a description of AFM suitability to various samples, sample preparation, tips for scanning and data processing, and a short bibliography. There is also a guide to recognising artifacts in AFM.

All the material here is discussed in greater length in the forthcoming book "Atomic Force Microscopy".