Important Note: All these errors will be corrected in the upcoming paperback edition. If you know of any more, let me know!
- Page 30 - Equation 2.6: Verr is used in place of Zerr in the first term.
- Page 38 - The last paragraph erroneously refers to equations 2.5, 2.6 and 2.7, where it should be 2.7, 2.8 and 2.9, respectively.
- page 53 - referring to the figure shown below:
In this figure, vertical bending is detected as "(A+B)-(C+D)", i.e. the difference of the top two and bottom two segments. On page 53 the book erroneously says "(A+B)-(C-D)".
- Page 56 - Figure 3.6 Should read: "B-intermittent contact oscillation (large)".
- Page 66 - Legend refers to colours in the image where there are none.
- Page 114 - Section 5.2.4: Three-dimensional views. Should read: "...special glasses to differentiate the left eye's and right eye's views...".
- Page 116 - Table 5.2. The Formula for skewness is incorect. The exponents should be 3, not 4. i.e., as shown below
- Page 164 - Misspelling of "fimbriae" as "fibriae".
Thanks very much to everyone who informed me of these errors!
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- What's this site about?
This site is designed to offer help with atomic force microscopy (AFM). AFM is an amazing and powerful technique for measuring images, and making other measurements of a wide range of samples. However, it can be rather daunting to use, especially for the beginner. On this website, as well as in the accompanying book we've collected a lot of information that explains how AFM works, and howto use AFM, and to process and analyse the images.
- What's AFM?
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Frequently Asked Questions about Atomic Force Microscopy
by Peter Eaton
This FAQ was originally created for clients of the AFM, i.e. those whose samples I scan.
However, it's grown a lot, and should also answer many questions of people planning to use the AFM themselves, or researching the technique. Its contents include a description of AFM suitability to various samples, sample preparation, tips for scanning and data processing, and a short bibliography. There is also a guide to recognising artifacts in AFM.
All the material here is discussed in greater detail in the book "Atomic Force Microscopy".
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