There is some information about it at this site, but it's somewhat out of date. In particular the contents listing is not quite correct.
Here is the correct contents of "Atomic Force Microscopy":
Chapter 1: Introduction
1.1 Background to AFM
1.2 AFM today
Chapter 2: Instrumental Aspects of AFM
2.1 Basic concepts in AFM instrumentation
2.2 The AFM stage
2.3 AFM electronics
2.4 Acquisition software
2.5 AFM cantilevers and probes
2.6 AFM instrument environment
2.7 Scanning environment
Chapter 3: AFM Modes
3.1 Topographic modes
3.2 Nontopographic modes
3.3 Surface modification
Chapter 4: Measuring AFM Images
4.1 Sample preparation
4.2 Measuring contact mode images
4.3 Measuring intermittent contact mode images
4.4 High-resolution imaging
4.5 Force curves
Chapter 5: Image Processing in AFM
5.1 Processing AFM images
5.2 Displaying AFM images
5.3 Analysing AFM Images
Chapter 6: Image Artifacts in AFM
6.1 Probe artefacts
6.2 Scanner artefacts
6.3 Image processing artefacts
6.4 Vibration noise
6.5 Noise from other sources
6.6 Other artefacts
Chapter 7: Applications of AFM
7.1 AFM applications in materials science
7.2 AFM applications in nanotechnology
7.3 AFM applications in the life sciences
7.4 Industrial AFM applications
Appendix A: AFM Standards
Appendix B: Scanner Calibration and Certification Procedures
Appendix C: Third Party AFM Software
To buy the book, visit Amazon.com
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Test for Chapter 1 - Introduction
Chapter 1 is the introduction chapter. Firstly the background to AFM is explained, which techniques preceded it, and how it came to be invented. Then some important characteristics of AFM are discussed, with reference to other microscopy techniques. This is a short chapter, covering briefly some material that occurs in greater details through the rest of the book; for this reason there are only 5 questions here.
Q1. What two major instruments preceded AFM?
Q2. Who invented the AFM and built the first ever instrument?
Q3. Which SPM technique is most commonly used, STM or AFM?
Q4. Which prize was given to the inventors of AFM and why?
Q5. Limitation in imaging what kind of sample limitation lead to the development of the AFM?
Long answer question.
Compare SEM, TEM with AFM. Under what circumstance would AFM be better than SEM, TEM and optical microscopy? Under what circumstance would AFM be worse than SEM, TEM and optical microscopy?
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This page has resources to help use the book "Atomic Force Microscopy" for learning and teaching about AFM.
Here are some quizzes based on the chapters in the book.
- The first quiz is based on Chapter 1 - the introduction to AFM.
- The second quiz is based on chapter 2, which is all about AFM instrumentation, and describes in detail how AFM instruments work:
- The third quiz is all about the different modes and experiments available in AFM:
- The fourth quiz covers the chapter on practical aspects of acquiring AFM images and other data:
- The fifth quiz is about processing, analysis and display of AFM data:
- The sixth and last quiz is about artifacts in AFM images.
I regularly teach AFM courses, which typically feature a mix of lectures and hands-on classes. When there are open classes, they will be announced on the front page of this website. The recurring course in Porto, the Porto AFM Workshop (formerly the Requimte AFM Workshop) is held annually in Porto, Portugal, and is described here.
AFM TEACHING RESOURCES
- AFM Poster - can be a useful aid to show how AFM works in your lab / classroom
- AFM slide - a simple slide showing a schematic of the workings of an AFM
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