Atomic Force Microscopy is now available to order from Amazon in the UK, see the link below.The book will arrive at amazon.com with some delay, since the shipping from the UK to the U.S. takes a while. You can also order from OUP direct, here.
This book is perfect for an introduction to AFM for new users, and I highly recommend it to researchers using the technique. It has lots of practical information on how to obtain AFM images, and also how to analyse and process the data. it also has an entire chapter devoted to what can go wrong with AFM, and how to avoid these problems! I believe it would also make an excellent coursebook, and some chapter quizzes will appear on this website soon. The quiz on the first chapter is already available here.
Click here to see Atomic Force Microscopy at Amazon.co.uk.
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I am adding quizzes based on each chapter, to enable a self-test check after you've read it, or to help in using the book in a course.
The first quiz was a short one based on Chapter 1. Here's the quiz for chapter 2. Chapter 2 is all about AFM instruments. It describes how they are built, and why they are built that way. It details the function of each component in an AFM, and also describe AFM probes in detail. There are section on the AFM, stage, electronics, software, cantilevers and probes, the instrument environment, and the sample cell. This chapter is useful if you use AFM, since you can use the instrument better when you know how it works.
Chapter 2
Short Questions
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I am adding some new entries to the AFM FAQ. Here they are below. To get the answer to your question, contact me with the contact page.
Sandhya asks:Can you please tell me about feed back control. I found it difficult to understand Proportional control, gain and band
and integral gain. From your FAQ AFM, I understand that set point is force
applied on sample by tip.
A: This is a very common question when people start to use AFM. Most AFMs use a PI controller. This is a kind of simplified PID controller. To control the feedback circuits, you change the P and I values. P stands for proportional and I for Integral. However, commonly in the AFM software they are referred to simply as P and I. To understand what these really mean, look at PID controllers on wikipedia, or look at chapter 3. In some instruments, D (derivative) may also be available.
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Follow user "afmhelp" on Twitter, or click the badge on the right in order to see all the latest updates to this website. Links to other materials of interest about Atomic Force Microscopy will also be posted.
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AFM Modes
Chapter 3 is all about the different AFM modes and experiments that can be carried out. The variety of different imaging methods, and the ability to use other modes to detect different properties of the sample, are the real reason for the widespread use of AFM.
In this chapter, the book covers: Topographic modes: contact mode and oscillating modes. Then it moves onto non-topographic modes, including force spectroscopy, Nanoindentation, mechanical property imaging, lateral force microscopy, phase imaging, other dynamic modes, magnetic force microscopy, EFM and SKPM, electrochemical AFM, and thermal modes.Finally, it also covers methods that allow surface modification.
Chapter 3 - AFM modes
Short Questions
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Subcategories
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