Magnetic Force Microscopy
Magnetic force microscopy (MFM), is a family of techniques used to measure magnetic fields using an AFM. In fact there are a large number of different techniques used to measure magnetic properties, but in general, they all use the AFM to measure the oscillation of a magnetically sensitive probe when it is far (5-100 nm) from the sample surface. MFM probes are usually made by coating normal silicon probes with a thin magnetic coating. The magnetic coating means that the oscillation of the probe will change when in a magnetic field. However, when the probe is touching the sample, the short range tip-sample forces will obscure the magnetic forces (which are much weaker). Fortunately, since magnetic forces can be measured at a distance, it is possible to remove the probe from the surface, and still measure magnetic forces, while removing these short range forces. In order to make accurate measurements, the probe should be at the same distance from the sample throughout the image. There are a number of techniques to do this, which are reviewed in [1], but in most commercial implementations, the so-called “Lifting” method first used by Bard [2] is used. This method is illustrated schematically below.
How MFM lifting modes work
In order to make MFM measurements with this lifting mode, an oscillating mode is used, typically intermittent contact mode AFM. For each line of the image, two scans are made. In the first line, the topography is measured as usual. The probe is then lifted a user-defined distance above the surface (typically in the range 5 to 50 nm). The second line will then be measured, but the topography measured in the first line is added to the height of the probe as it scans along the line. In this way, the instrument attempts to keep the probe at exactly the same distance from the sample surface at each point in the MFM image. MFM is widely used to generate images of magnetic fields associated with small domains, and is particularly of use in the development of magnetic recording technology . It can also show magnetic fields associated with individual magnetic nanoparticles[3]. However, interpretation of MFM signals is complicated by the unknown nature of the probe, and it is limited to measuring fairly intense fields[4,1].

The image above shows topogrpahic (left) and magnetic field (right) images of a cluster of magnetic nanoparticles.
References
Eaton P et al. (2010) Atomic force microscopy. OUP, Oxford
Lin CW et al. (1987). J Electrochem Soc 134:1038-1039.
Neves CS et al. (2010). Nanotechnology 21:305706.
Schreiber S et al. (2008). Small 4:270-278.
This article was condensed from “Atomic Force Microscopy” by Eaton and West, OUP, 2010. The article comes from Chapter 3, which describes all of the commonly used modes in Atomic Force Microscopes. The Article in the book also contains a full reference list.
Images in this article come from the book, and are Copyright Peter Eaton/ OUP 2010.
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At the moment, I have disabled user registration and login. Most of you never login, and the only advantage to do so, is that you can submit pictures to the gallery, so it wont have much negative effect. I did this because the user registraiton was getting spammed with fake accounts. If I figure out how to add some effective captcha to stop this heppening, I may re-enable the user menu in the future.
-Pete
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The Manager of this instrument is: Francisco Jorge Caldeira.
Contact: This email address is being protected from spambots. You need JavaScript enabled to view it. or This email address is being protected from spambots. You need JavaScript enabled to view it.
AFM Lab DQ-FCT-UNL, Caparica.
HelloI am a TT-AFM from AFM workshop.com... I was born (Jorge Caldeira assembled me) in Signal Hill CA USA, so he named me...Signal Hill !I travel from Signal Hill CA USA to Monte de Caparica Portugal ... Later I visit my twin machine Long Beach in Porto for the 2013 AFM course, and to pay its visit to Caparica in the 2011 AFM course.So both TT-AFM's were the first machines assembled and we traveled each almost 10 000 km ...so far...See the place were I was made .... and Leonor's hair that I imaged and got her the AFM 2013 course prize... Can I use AFM ? Yes you can ...

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PEDOT on Paper Cesar Laia Jorge Caldeira
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Pf1 bacteriophage cytochrome c electrostatic complex macroscopic fibers
Heber Silva Ruben Chaves Jorge Caldeira Peter Eaton CiiEM ISCSEM Requimte |
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Tooth dentinal tubes Acid atacked hipoclorite cleaned
João Oliveira Jorge Caldeira CiiEM ISCSEM Requimte FCT UNL
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Polymeric nanoparticles, formed from polystyrene with pending hydrophilic glucose moieties
Krasimira Petrova Requimte FCT UNL |
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Polymeric nanoparticles (PNPs) based on amphiphilic polymeric conjugates composed of cholic acid, sucrose and PEG. Carina Crucho Teresa Barros Requimte FCT UNL |
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Dental restoration resins and polishing systems
Rita Simões Jorge Caldeira CiiEM ISCSEM Requimte FCT UNL
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Classic Maya chrysoprase maskette pendant ca. 800 AD
Hugo Miguel Crespo Faculdade de Letras Universidade de Lisboa
Ana Pereira DCR FCT UNL
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Core-shell polymeric nanoparticles, formed from polystyrene with pending bifunctional glucose Krasimira Petrova Requimte FCT UNL
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Nanoestructured (nanocal), synthesized from metallic Ca CaO Þ Ca(OH)2 + CO2 Þ CaCO3 Giovanni Borsoi LNEC Portugal TU Delft Holland |
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Photochemical dendrimeric polymerization of tripodal coumarin João Avo João Lima Jorge Parola Requimte FCT UNL |
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Pseudomonas aeruginosa with bacteriphage Pf1 | Patricia Montez Héber Silva, Ruben Chaves Jorge Caldeira
Dechorosprillium sp Bacteria | Cristina Costa
Yeast | Madalena Oom
Magnetically Aligned Pf1 Virus + Protein assocaition | Ruben C., Héber S., Celina S., P. Eaton
Magnetic Nano Particles Fe3O4 "bare" 10x10 μm Image | Cecília Roque, Sara Santana
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Vertically polsihed Tooth sample 20x20 μm Image | J.Martins dos Santos, Ana Mano Azul, Mario.Polido, João Oliveira e Jorge Caldeira

Instrument Information

This instrument is a modified TT-AFM from AFMWorkshop.
- Instrument Configuration: Light lever (optical lever) - based sample-scanning AFM
- Sample Sizes:ca. 13x13x5 mm
- Imaging Modes: vibrating (tapping), non-vibrating (contact), phase imaging, lateral force microscopy (friction force microscopy)*
- Imaging Environment: Air or Liquid* (experimental).
- Z-translation: Vertical direct drive (1micron resolution)
- XY Translation: manual micrometers
- Video Optical Microscope: Zoom to 400X, 3 micron resolution (3M pixel camera)
- Scan Range: 70x70x17 microns
- Linearisation: All axes (x, y and z) with strain guages, can be turned off for enhanced signal to noise ratio.
- Z noise level: less than 0.2 Angstrom
- Vibration isolation: homemade passive solution


Protocols
- Startup Procedure
- Shutdown Procedure
- Scanning in contact "non-vibrating" mode
- Scanning in tapping "vibrating" mode
- These protocols are currently in development, meanwhile, here is a link to the latest version of the protocols word document for use of "Long Beach": TTAFM_protocols.doc
Back to Requimte Page Go to Porto Lab Page
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This instrument is supervised by: Peter Eaton, contact: This email address is being protected from spambots. You need JavaScript enabled to view it.


This instrument is a modified TT-AFM from AFM Workshop.
It is equipped with two scanners, enabling large (low resolution ) or small (high resolution) scanners. It has an experimental liquid cell for in-situ measurements.
Here are more detailed specifications:
- Instrument Configuration: Light lever (optical lever) - based sample-scanning AFM
- Sample Sizes:ca. 13x13x5 mm
- Imaging Modes: vibrating (tapping), non-vibrating (contact), phase imaging, lateral force microscopy (friction force microscopy)*
- Imaging Environment: Air or Liquid* (experimental).
- Z-translation: Vertical direct drive (1micron resolution)
- XY Translation: manual micrometers
- Video Optical Microscope: Zoom to 400X, 3 micron resolution (3M pixel camera)
- Scan Range: 70x70x17 microns or 20x20x7 microns
- Linearisation: All axes (x, y and z) with strain gauges, which can be turned off for enhanced signal to noise ratio.
- Z noise level: less than 0.2 Angstrom
- Vibration isolation: compact passive vibration isolation
*These features are not yet tested.
Booking Schedule and Calendar:
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| Phase image of E. coli | Many E. coli | Amplitude E. coli |
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Silicon grid showing |
Phase image of spores |
Cell growing from spores - 3D |
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| Leishmania cell | Epithelial cell |
Protocols
- Startup Procedure
- Shutdown Procedure
- Insertion and laser alignment of probes
- Scanning in contact "non-vibrating" mode
- Approaching in vibrating mode
- Scanning in tapping or "vibrating" mode
- Opening files: We recommend using Gwyddion version 2.22 or later.
- These protocols are currently in development, meanwhile, here is a link to the latest version of the protocols word document for use of "Long Beach": TTAFM_protocols.doc
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- Turn on PC: Allow to boot to Windows. Turn on monitor
- Turn on EBox; all seven green lights should come on1
- Start Software (e.g. AFM Workshop 1.5.6.exe)
- Remove dust sheet from AFM
- Connect video camera to USB if necessary
- Turn on video camera light source
- Remove dust cap from video microscope
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Subcategories
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